O magnetometro a Efeito Kerr e o filme fino de Co/Si

AUTOR(ES)

Hugo Bonette de Carvalho

DATA DE PUBLICAÇÃO

2002

RESUMO

The aim of this work was to study and implement a technique for the characterization of the magnetic properties of thin films through a Kerr magnetometer (MEK). First we present the phenomenology behind the magneto-optic Kerr effect. In the sequence we present the magnetometer (MEK) and the experimental procedures applied to get hysteresis loops from the magnetic thin films. Finally we present the results of the magnetic and morphologic characterization of thin films of Co deposited by magnetron sputtering onto Si (100) with thickness ranging from 30 to 950Å. We discuss the correlation among roughness, thickness and magnetic properties of the Co films. The film microstructure was characterized by x-ray diffraction and AFM (Atomic Force Microscopy). We have used the MEK to investigate the hysteresis loops and the in-plane switching behaviour as a function of the applied magnetic field orientation and as a function of temperature. The magnetic domain characterization was carried out by longitudinal magneto-optical Kerr microscopy

ASSUNTO(S)

efeito de kerr anisotropia magnetica filmes finos cobalto - propriedades magneticas magnetoptica cobalto - propriedades termicas magnetometro

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