Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors

AUTOR(ES)

Smilgies, Detlef-M.

FONTE

International Union of Crystallography

RESUMO

Various aspects of the application of the Scherrer formula to grain-size analysis in thin films of soft materials are discussed within the methodology of grazing-incidence small- and wide-angle scattering and in conjunction with the use of area detectors.

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