Load Induced Pulse Broadening Effect
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1. Single event transients in logic circuits - load and propagation induced pulse broadening
The generation and propagation of single event transients (SET) in logic gate chains is studied and modeled. Regarding SET generation, we investigate the dependence of the generated SET pulse width on the struck node capacitance. Rising node capacitance may lead to amplified pulse width, indicating that increasing load capacitance alone is not an option for
Publicado em: 2011